| Literature DB >> 11017406 |
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Abstract
X-ray diffraction was used to monitor the structure of 45 A diameter CdSe nanocrystals as they transformed repeatedly between fourfold and sixfold coordinated crystal structures. Simulations of the diffraction patterns reveal that a shape change occurs as the crystals transform. They also show that stacking faults are generated in the transition from the high- to the low-pressure phase. The shape change and stacking fault generation place significant constraints on the possible microscopic mechanism of the phase transition.Year: 2000 PMID: 11017406 DOI: 10.1103/PhysRevLett.84.923
Source DB: PubMed Journal: Phys Rev Lett ISSN: 0031-9007 Impact factor: 9.161