The use of multiple-scattering data to enhance small-angle neutron scattering experiments.

Multiple scattering of neutrons by the inhomogeneities responsible for small-angle neutron scattering (SANS) during the passage of the beam through the specimen can be used to provide valuable information about the shape of the objects and the absolute value of the contrast between the scattering particles and the matrix. The neutrons emerging from the specimen are classified into those that have been scattered n times. The index n ranges from zero to infinity. The remnant of the incident beam is the group of neutrons for which n equals zero. Each group contributes separately to the scattering profile. The small-angle scattering cross section is independent of the neutron wavelength for n = 1 only. Thus collection of data as a function of specimen thickness and of neutron wavelength will provide a number of different profiles describing the same physical situation. Simultaneous analysis of these profiles provides absolute values of the cross section for scattering into the small-angle region and of the cross section for removal of neutrons from the small-angle region. So that the method can be used generally, a profile function that is a very good approximation to those in the literature is introduced. The implications for time-of-flight SANS are discussed.