M J Shinchi1, K Soma, N Nakabayashi. 1. First Department of Orthodontics, Faculty of Dentistry, Tokyo Medical and Dental University, 1-5-45 Yushima, Bunkyo-ku, Tokyo 113-8549, Japan.
Abstract
OBJECTIVES: To determine the relationship between depth of penetration and tensile bond strength of a photo-cured resin to phosphoric acid etched enamel, and the efficacy of enamel etchants that are less aggressive than a concentration of 10% H3PO4. METHODS: The tensile bond strength and length of tags produced by a photo-cured (20 s) resin consisting of pre-polymerized TMPT/silica in 3% HNPM-TEGDMA on acid-etched enamel was determined. The enamel etchants tested were various concentrations (3-65%) of phosphoric acid. The resin was applied to enamel samples that had been abraded with No. 600-grit SiC paper and acid etched (30 s) to create test specimens that were loaded to fracture on a testing device. The HCl-treated, then cut specimens, were examined under scanning electron microscopy and light microscopy. RESULTS: The tensile bond strength (10 MPa) of resin to enamel, pre-treated with various acid concentrations did not vary significantly. But resin tag length was found to decrease significantly from 22 microns for 35% H3PO4 to 12 microns for 20% H3PO4 to 9 microns for 5, 10 and 65% H3PO4 to 5 microns for 3% H3PO4. SIGNIFICANCE: These findings suggest that the length of the tags created by the tested photo-cured resin on phosphoric acid-etched enamel contributes little to the bond strength of the test specimens, and that the adhesive strength of the resin to H3PO4 etched enamel is mainly attributable to the resin's ability to penetrate between the enamel crystallites and rods. Further, enamel pre-treatment by phosphoric acid etchants of concentrations lower than 10% may be satisfactorily employed. The use of less aggressive acid concentrations might minimize any potential adverse effects to enamel substrates.
OBJECTIVES: To determine the relationship between depth of penetration and tensile bond strength of a photo-cured resin to phosphoric acid etched enamel, and the efficacy of enamel etchants that are less aggressive than a concentration of 10% H3PO4. METHODS: The tensile bond strength and length of tags produced by a photo-cured (20 s) resin consisting of pre-polymerized TMPT/silica in 3% HNPM-TEGDMA on acid-etched enamel was determined. The enamel etchants tested were various concentrations (3-65%) of phosphoric acid. The resin was applied to enamel samples that had been abraded with No. 600-grit SiC paper and acid etched (30 s) to create test specimens that were loaded to fracture on a testing device. The HCl-treated, then cut specimens, were examined under scanning electron microscopy and light microscopy. RESULTS: The tensile bond strength (10 MPa) of resin to enamel, pre-treated with various acid concentrations did not vary significantly. But resin tag length was found to decrease significantly from 22 microns for 35% H3PO4 to 12 microns for 20% H3PO4to 9 microns for 5, 10 and 65% H3PO4 to 5 microns for 3% H3PO4. SIGNIFICANCE: These findings suggest that the length of the tags created by the tested photo-cured resin on phosphoric acid-etched enamel contributes little to the bond strength of the test specimens, and that the adhesive strength of the resin to H3PO4 etched enamel is mainly attributable to the resin's ability to penetrate between the enamel crystallites and rods. Further, enamel pre-treatment by phosphoric acid etchants of concentrations lower than 10% may be satisfactorily employed. The use of less aggressive acid concentrations might minimize any potential adverse effects to enamel substrates.
Authors: Antarmayee Panigrahi; K T Srilatha; Rajat G Panigrahi; Susant Mohanty; Sanat K Bhuyan; Debojyoti Bardhan Journal: J Clin Diagn Res Date: 2015-07-01