Literature DB >> 10061106

Noise-induced roughening evolution of amorphous Si films grown by thermal evaporation.

.   

Abstract

Entities:  

Year:  1996        PMID： 10061106     DOI： 10.1103/PhysRevLett.76.3774

Source DB:  PubMed          Journal:  Phys Rev Lett        ISSN： 0031-9007            Impact factor:   9.161


× No keyword cloud information.
  1 in total

1.  Time Invariant Surface Roughness Evolution during Atmospheric Pressure Thin Film Depositions.

Authors:  Thomas Merkh; Robert Spivey; Toh Ming Lu
Journal:  Sci Rep       Date:  2016-01-27       Impact factor: 4.379
  1 in total

北京卡尤迪生物科技股份有限公司 © 2022-2023.