Literature DB >> 10057258

Semiconductor surface roughness: Dependence on sign and magnitude of bulk strain.

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Abstract

Year:  1994        PMID： 10057258     DOI： 10.1103/PhysRevLett.73.3006

Source DB:  PubMed          Journal:  Phys Rev Lett        ISSN： 0031-9007            Impact factor:   9.161


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  2 in total

1.  Fluorescence analysis with quantum dot probes for hepatoma under one- and two-photon excitation.

Authors:  Xuefeng Yu; Liangdong Chen; Yuliang Deng; Kaiyang Li; Ququan Wang; Yan Li; Si Xiao; Li Zhou; Xuan Luo; Jia Liu; Daiwen Pang
Journal:  J Fluoresc       Date:  2007-02-06       Impact factor: 2.217

2.  Electrical isolation of dislocations in Ge layers on Si(001) substrates through CMOS-compatible suspended structures.

Authors:  Vishal Ajit Shah; Maksym Myronov; Chalermwat Wongwanitwatana; Lewis Bawden; Martin J Prest; James S Richardson-Bullock; Stephen Rhead; Evan H C Parker; Terrance E Whall; David R Leadley
Journal:  Sci Technol Adv Mater       Date:  2012-11-26       Impact factor: 8.090
  2 in total

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