Literature DB >> 10056116

Measurement of the silicon (220) lattice spacing.

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Abstract

Year:  1994        PMID： 10056116     DOI： 10.1103/PhysRevLett.72.3133

Source DB:  PubMed          Journal:  Phys Rev Lett        ISSN： 0031-9007            Impact factor:   9.161


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  5 in total

1.  Unsuitability of (12)C 60 as a standard of atomic weight.

Authors:  P Williams; R C Barber; K S Sharma; H E Duckworth
Journal:  J Am Soc Mass Spectrom       Date:  1995-12       Impact factor: 3.109

2.  Contemporary x-ray wavelength metrology and traceability.

Authors:  L T Hudson; J P Cline; A Henins; M H Mendenhall; C I Szabo
Journal:  Radiat Phys Chem Oxf Engl 1993       Date:  2019-07-03       Impact factor: 2.858

3.  Precision Measurement of Fundamental Constants Using GAMS4.

Authors:  M S Dewey; E G Kessler
Journal:  J Res Natl Inst Stand Technol       Date:  2000-02-01

4.  Si96: A New Silicon Allotrope with Interesting Physical Properties.

Authors:  Qingyang Fan; Changchun Chai; Qun Wei; Peikun Zhou; Junqin Zhang; Yintang Yang
Journal:  Materials (Basel)       Date:  2016-04-13       Impact factor: 3.623

5.  A Novel Silicon Allotrope in the Monoclinic Phase.

Authors:  Chaogang Bai; Changchun Chai; Qingyang Fan; Yuqian Liu; Yintang Yang
Journal:  Materials (Basel)       Date:  2017-04-22       Impact factor: 3.623
  5 in total

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