Literature DB >> 10055484

Identification of strained silicon layers at Si-SiO2 interfaces and clean Si surfaces by nonlinear optical spectroscopy.

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Abstract

Entities:  

Year:  1993        PMID： 10055484     DOI： 10.1103/PhysRevLett.71.1234

Source DB:  PubMed          Journal:  Phys Rev Lett        ISSN： 0031-9007            Impact factor:   9.161


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  1 in total

Review 1.  A few selected applications of surface nonlinear optical spectroscopy.

Authors:  Y R Shen
Journal:  Proc Natl Acad Sci U S A       Date:  1996-10-29       Impact factor: 11.205
  1 in total

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