Authors: K Bodek; G Ban; M Beck; A Bialek; T Bryś; A Czarnecki; W Fetscher; P Gorel; K Kirch; St Kistryn; A Kozela; M Kuźniak; A Lindroth; O Naviliat-Cuncic; J Pulut; A Serebrov; N Severijns; E Stephan; J Zejma Journal: J Res Natl Inst Stand Technol Date: 2005-08-01