Literature DB >> 10045119

Oxygen frustration and the interstitial carbon-oxygen complex in Si.

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Abstract

Entities:  

Year:  1992        PMID: 10045119     DOI: 10.1103/PhysRevLett.68.86

Source DB:  PubMed          Journal:  Phys Rev Lett        ISSN: 0031-9007            Impact factor:   9.161


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  1 in total

1.  Carbon related defects in irradiated silicon revisited.

Authors:  H Wang; A Chroneos; C A Londos; E N Sgourou; U Schwingenschlögl
Journal:  Sci Rep       Date:  2014-05-09       Impact factor: 4.379

  1 in total

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