Literature DB >> 10044240

Submicron-scale surface roughening induced by ion bombardment.

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Abstract

Year:  1991        PMID： 10044240     DOI： 10.1103/PhysRevLett.67.1759

Source DB:  PubMed          Journal:  Phys Rev Lett        ISSN： 0031-9007            Impact factor:   9.161


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  3 in total

1.  Effect of tetramethylammonium hydroxide/isopropyl alcohol wet etching on geometry and surface roughness of silicon nanowires fabricated by AFM lithography.

Authors:  Siti Noorhaniah Yusoh; Khatijah Aisha Yaacob
Journal:  Beilstein J Nanotechnol       Date:  2016-10-17       Impact factor: 3.649

2.  Effect of Grazing Angle Cross-Ion Irradiation on Ag Thin Films.

Authors:  Manish Kumar; Teena Jangid; Vandana Panchal; Praveen Kumar; Abhishek Pathak
Journal:  Nanoscale Res Lett       Date:  2016-10-11       Impact factor: 4.703

3.  Nanoscale structural defects in oblique Ar+ sputtered Si(111) surfaces.

Authors:  Divya Gupta; Mahak Chawla; Rahul Singhal; Sanjeev Aggarwal
Journal:  Sci Rep       Date:  2019-10-29       Impact factor: 4.379
  3 in total

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