Literature DB >> 10038247

Comparison of amorphous and quasicrystalline films of sputtered Al0.72Mn0.22Si0.06.

.   

Abstract

Year:  1988        PMID： 10038247     DOI： 10.1103/PhysRevLett.60.2062

Source DB:  PubMed          Journal:  Phys Rev Lett        ISSN： 0031-9007            Impact factor:   9.161


× No keyword cloud information.
  1 in total

1.  Electron Diffraction Using Transmission Electron Microscopy.

Authors:  L A Bendersky; F W Gayle
Journal:  J Res Natl Inst Stand Technol       Date:  2001-12-01
  1 in total

北京卡尤迪生物科技股份有限公司 © 2022-2023.