Literature DB >> 10035481

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Abstract

Year:  1987        PMID： 10035481     DOI： 10.1103/PhysRevLett.59.213

Source DB:  PubMed          Journal:  Phys Rev Lett        ISSN： 0031-9007            Impact factor:   9.161


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  3 in total

1.  The impact of thickness and thermal annealing on refractive index for aluminum oxide thin films deposited by atomic layer deposition.

Authors:  Zi-Yi Wang; Rong-Jun Zhang; Hong-Liang Lu; Xin Chen; Yan Sun; Yun Zhang; Yan-Feng Wei; Ji-Ping Xu; Song-You Wang; Yu-Xiang Zheng; Liang-Yao Chen
Journal:  Nanoscale Res Lett       Date:  2015-02-06       Impact factor: 4.703

2.  Optical Calibration of a Submicrometer Magnification Standard.

Authors:  Jon Geist; Barbara Belzer; Mary Lou Miller; Peter Roitman
Journal:  J Res Natl Inst Stand Technol       Date:  1992 Mar-Apr

3.  Ultrathin silicon oxynitride layer on GaN for dangling-bond-free GaN/insulator interface.

Authors:  Kengo Nishio; Tomoe Yayama; Takehide Miyazaki; Noriyuki Taoka; Mitsuaki Shimizu
Journal:  Sci Rep       Date:  2018-01-23       Impact factor: 4.379
  3 in total

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