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Literature DB >> 10034508

Direct lifetime measurements and interactions of charged defect states in submicron Josephson junctions.

Abstract

Source DB: PubMed Journal: Phys Rev Lett ISSN： 0031-9007 Impact factor: 9.161

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Authors: Lunjie Zeng; Dung Trung Tran; Cheuk-Wai Tai; Gunnar Svensson; Eva Olsson
Journal: Sci Rep Date: 2016-07-12 Impact factor: 4.379

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