Literature DB >> 10033115

Universal conductance fluctuations in silicon inversion-layer nanostructures.

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Abstract

Year:  1986        PMID： 10033115     DOI： 10.1103/PhysRevLett.56.2865

Source DB:  PubMed          Journal:  Phys Rev Lett        ISSN： 0031-9007            Impact factor:   9.161


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  1 in total

1.  Time-dependent universal conductance fluctuations in IrO2 nanowires.

Authors:  Yong-Han Lin; Lu-Yao Wang; Juhn-Jong Lin
Journal:  Nanoscale Res Lett       Date:  2012-12-13       Impact factor: 4.703
  1 in total

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