Literature DB >> 10032977

Universal conductance fluctuations in narrow Si accumulation layers.

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Abstract

Entities:  

Year:  1986        PMID： 10032977     DOI： 10.1103/PhysRevLett.56.2403

Source DB:  PubMed          Journal:  Phys Rev Lett        ISSN： 0031-9007            Impact factor:   9.161


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  1 in total

1.  Two-dimensional universal conductance fluctuations and the electron-phonon interaction of surface states in Bi2Te2Se microflakes.

Authors:  Zhaoguo Li; Taishi Chen; Haiyang Pan; Fengqi Song; Baigeng Wang; Junhao Han; Yuyuan Qin; Xuefeng Wang; Rong Zhang; Jianguo Wan; Dingyu Xing; Guanghou Wang
Journal:  Sci Rep       Date:  2012-08-22       Impact factor: 4.379
  1 in total

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