Literature DB >> 10032857

Grain-boundary resistance in polycrystalline metals.

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Abstract

Year:  1986        PMID： 10032857     DOI： 10.1103/PhysRevLett.56.2100

Source DB:  PubMed          Journal:  Phys Rev Lett        ISSN： 0031-9007            Impact factor:   9.161


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  4 in total

1.  Mapping the nanoscale effects of charge traps on electrical transport in grain structures of indium tin oxide thin films.

Authors:  Hyesong Jeon; Jeongsu Kim; Shashank Shekhar; Jeehye Park; Seunghun Hong
Journal:  Nanoscale Adv       Date:  2021-07-14

2.  Anomalous electrical conduction and negative temperature coefficient of resistance in nanostructured gold resistive switching films.

Authors:  M Mirigliano; S Radice; A Falqui; A Casu; F Cavaliere; P Milani
Journal:  Sci Rep       Date:  2020-11-12       Impact factor: 4.379

3.  Enhanced Conductivity and Microstructure in Highly Textured TiN1-x /c-Al2O3 Thin Films.

Authors:  Alexander Zintler; Robert Eilhardt; Stefan Petzold; Sankaramangalam Ulhas Sharath; Enrico Bruder; Nico Kaiser; Lambert Alff; Leopoldo Molina-Luna
Journal:  ACS Omega       Date:  2022-01-03

4.  Non-ohmic behavior and resistive switching of Au cluster-assembled films beyond the percolation threshold.

Authors:  M Mirigliano; F Borghi; A Podestà; A Antidormi; L Colombo; P Milani
Journal:  Nanoscale Adv       Date:  2019-07-01
  4 in total

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