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Literature DB >> 10032434

Dependence of 1/f noise on defects induced in copper films by electron irradiation.

Abstract

Entities: Disease

Source DB: PubMed Journal: Phys Rev Lett ISSN： 0031-9007 Impact factor: 9.161

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Authors: Sheng-Shiuan Yeh; Wen-Yao Chang; Juhn-Jong Lin
Journal: Sci Adv Date: 2017-06-23 Impact factor: 14.136

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