Literature DB >> 10030884

Sensitivity-enhanced electron-holographic interferometry and thickness measurement applications at atomic scale.

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Abstract

Year:  1985        PMID： 10030884     DOI： 10.1103/PhysRevLett.54.60

Source DB:  PubMed          Journal:  Phys Rev Lett        ISSN： 0031-9007            Impact factor:   9.161


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  2 in total

1.  Direct observation of thitherto unobservable quantum phenomena by using electrons.

Authors:  Akira Tonomura
Journal:  Proc Natl Acad Sci U S A       Date:  2005-09-06       Impact factor: 11.205

Review 2.  The Aharonov-Bohm effect and its applications to electron phase microscopy.

Authors:  Akira Tonomura
Journal:  Proc Jpn Acad Ser B Phys Biol Sci       Date:  2006-04       Impact factor: 3.493
  2 in total

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