Literature DB >> 10011557

Influence of the roughness profile on the specular reflectivity of x rays and neutrons.

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Abstract

Entities:  

Year:  1994        PMID： 10011557     DOI： 10.1103/physrevb.49.5817

Source DB:  PubMed          Journal:  Phys Rev B Condens Matter        ISSN： 0163-1829


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  4 in total

1.  Membrane structure characterization using variable-period x-ray standing waves.

Authors:  R Zhang; R Itri; M Caffrey
Journal:  Biophys J       Date:  1998-04       Impact factor: 4.033

2.  Spatial resolution of the variable-period x-ray standing-wave method as applied to model membranes.

Authors:  R Itri; R Zhang; M Caffrey
Journal:  Biophys J       Date:  1997-09       Impact factor: 4.033

3.  Asymmetric structural features in single supported lipid bilayers containing cholesterol and GM1 resolved with synchrotron X-Ray reflectivity.

Authors:  Christian Reich; Margaret R Horton; Bärbel Krause; Alice P Gast; Joachim O Rädler; Bert Nickel
Journal:  Biophys J       Date:  2008-03-28       Impact factor: 4.033

4.  Incorporation of interfacial roughness into recursion matrix formalism of dynamical X-ray diffraction in multilayers and superlattices.

Authors:  Ihar Lobach; Andrei Benediktovitch; Alexander Ulyanenkov
Journal:  J Appl Crystallogr       Date:  2017-04-13       Impact factor: 3.304
  4 in total

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