Literature DB >> 10011047

Role of interfacial oxide-related defects in the red-light emission in porous silicon.

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Abstract

Entities:  

Year:  1994        PMID： 10011047     DOI： 10.1103/physrevb.49.2238

Source DB:  PubMed          Journal:  Phys Rev B Condens Matter        ISSN： 0163-1829


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  1 in total

Review 1.  A Review: Preparation, Performance, and Applications of Silicon Oxynitride Film.

Authors:  Yue Shi; Liang He; Fangcao Guang; Luhai Li; Zhiqing Xin; Ruping Liu
Journal:  Micromachines (Basel)       Date:  2019-08-20       Impact factor: 2.891
  1 in total

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