Literature DB >> 10010574

Structure, energetics, and dissociation of Si-H bonds at dangling bonds in silicon.

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Abstract

Entities:  

Year:  1994        PMID： 10010574     DOI： 10.1103/physrevb.49.14766

Source DB:  PubMed          Journal:  Phys Rev B Condens Matter        ISSN： 0163-1829


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  1 in total

1.  Piezoresistive sensitivity, linearity and resistance time drift of polysilicon nanofilms with different deposition temperatures.

Authors:  Changzhi Shi; Xiaowei Liu; Rongyan Chuai
Journal:  Sensors (Basel)       Date:  2009-02-23       Impact factor: 3.576
  1 in total

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